Welcome to Journal of Beijing Institute of Technology
Wang Hao, Wang Xiufen, Guo Lin, Zhu Hesun. Study on the Dielectric Properties of Chemical Vapor Deposited Diamond FilmJ. JOURNAL OF BEIJING INSTITUTE OF TECHNOLOGY, 1998, 7(3): 274-279.
Citation: Wang Hao, Wang Xiufen, Guo Lin, Zhu Hesun. Study on the Dielectric Properties of Chemical Vapor Deposited Diamond FilmJ. JOURNAL OF BEIJING INSTITUTE OF TECHNOLOGY, 1998, 7(3): 274-279.

Study on the Dielectric Properties of Chemical Vapor Deposited Diamond Film

  • Aim To study the dielectric properties of diamond film. Methods Dielectric properties (the frequency dependenCe of conductance, permittivity, and loss factor) of diamond film preped by DC are plasma jet chemical vapor deposition (CVD) were studied. Resuls Dielectric properties of CVD diamond fAn depend mainly on its polycrystalline nature, and the presence of non-diamond disordered graphitic regions and impurities between diamond grains of the film. Annealing at 500℃ leads to the removal of greater part of disordered graphitic regions, but am not remove all disordered graphitic regions and impurities. Conclusion Much work nab to be done tO prepare or post-treat diamond films before using CVD diamond as a substrate for electronic devices.
  • loading

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return
    Baidu
    map